Scanning electron microscopes (SEMs) and atomic force microscopes (AFMs) require vibration amplitudes < 0.1 µm. Wave pads, often in series with active isolation, provide low-cost pre-filtering.
Designers often implement specially designed Electrostatic Discharge (ESD) protection on these pads to safeguard sensitive high-frequency circuits without introducing excessive noise or signal loss. wave pads
[ IL = 20 \log_10 \left( \fraca_base, rigida_base, with\ pad \right) ] 0.1 µm. Wave pads